Vol. 51 No. 8
August, 2002
Surface Analysis of Magnetic Thin Film Media
Hirofumi Kondo 569
Hitoshi Hoshino 597
Localized Surface Analysis by Grazing-Exit X-ray Spectrometry and a Scanning Tunneling Microscope
Kouichi Tsuji 605
Yuetsu Danzaki 613
Determination of Impurities in Pure Iron, Iron Alloys and Iron Oxide by Cupferron Separation/ICP-OES
Yuetsu Danzaki 619
Tetsuo Hashimoto, Takahiro Nakagawa, Hayato Usuda and Takashi Yawata 625
Analysis and Leaching Experiment of Slag Produced by an Arc Plasma Treatment of Fly Ash
Yorie Kaneko, Masaki Ohata, Naoki Furuta, Yuya Kubo and Tsugunori Inaba 633
Yuji Suzuki 641
Kenji Kurihara, Fumiyo Tsuchiya and Tadao Shoji 647
Determination of Trace of Total Silicon in High-Purity Copper by Molybdosilicate
Hitoshi Yamaguchi, Shinji Itoh, Shukuro Igarashi and Takeshi Kobayashi 653
Quenching Time Profile of Rhodamine B Through Ion Association with Hetero-polymolybdate Ion
Junichi Isoe, Emiko Kaneko, Suwaru Hoshi and Kunihiko Akatsuka 657
Ryo Kato 661
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