Analytical Sciences

Cover image of volume 26, number 2

Volume 26, Number 2 (2010)

Special Issue: Advances in Surface Chemical Analysis —From Fundamentals to Standardization —

Cover illustration: "Si 1s spectra of SiO2. The Structure is measured in angular mode by hard X-ray photoelectron spectroscopy (HXPS) system with monochromatic Cr Kα X-ray." by M. Kobata(p.227). See larger image

Hot Articles − Volume 26, Number 2 (2010)

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SERS Measurements of Magnetic Stretching Force-Induced Trans-Gauche Conformational Change
Takeyoshi GOTO and Hitoshi WATARAI
Analytical Sciences, 2010, 26(2), 135.
DOI: 10.2116/analsci.26.135
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Conducting Polymer-coated Electrode as a Reference/Counter Electrode in an Organic Phase and Its Application to a Two-electrode Type Thin-layer Cell for Voltammetry at the Liquid | Liquid Interface
Yumi YOSHIDA, Satoshi YAMAGUCHI, and Kohji MAEDA
Analytical Sciences, 2010, 26(2), 137.
DOI: 10.2116/analsci.26.137
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Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
Mineharu SUZUKI, Nobuaki URUSHIHARA, Noriaki SANADA, Dennis F. PAUL, Scott BRYAN, and John S. HAMMOND
Analytical Sciences, 2010, 26(2), 203.
DOI: 10.2116/analsci.26.203
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Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
Masaaki KOBATA, Igor PÍŠ, Hideo IWAI, Hiromichi YAMAZUI, Hiroaki TAKAHASHI, Mineharu SUZUKI, Hiroyuki MATSUDA, Hiroshi DAIMON, and Keisuke KOBAYASHI
Analytical Sciences, 2010, 26(2), 227.
DOI: 10.2116/analsci.26.227
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Table of Contents − Volume 26, Number 2 (2010)

Rapid Communications

hot article mark
SERS Measurements of Magnetic Stretching Force-Induced Trans-Gauche Conformational Change
Takeyoshi GOTO and Hitoshi WATARAI
Analytical Sciences, 2010, 26(2), 135.
DOI: 10.2116/analsci.26.135
go to page top

hot article mark
Conducting Polymer-coated Electrode as a Reference/Counter Electrode in an Organic Phase and Its Application to a Two-electrode Type Thin-layer Cell for Voltammetry at the Liquid | Liquid Interface
Yumi YOSHIDA, Satoshi YAMAGUCHI, and Kohji MAEDA
Analytical Sciences, 2010, 26(2), 137.
DOI: 10.2116/analsci.26.137
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Fabrication of a Carbon Sphere-modified Electrode and Sensitive Determination of Cadmium(II)
Xiangliang NIE, and Weibing HU
Analytical Sciences, 2010, 26(2), 141.
DOI: 10.2116/analsci.26.141
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Simultaneous Injection-Effective Mixing Analysis of Palladium
Norio TESHIMA, Daisuke NOGUCHI, Yasutaka JOICHI, Narong LENGHOR, Noriko OHNO, Tadao SAKAI, and Shoji MOTOMIZU
Analytical Sciences, 2010, 26(2), 143.
DOI: 10.2116/analsci.26.143
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Special Issue: Advances in Surface Chemical Analysis
—From Fundamentals to Standardization—
Guest Editorial
Shigeo TANUMA
Analytical Sciences, 2010, 26(2), 145.
DOI: 10.2116/analsci.26.145
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Reviews

Introductory Photoemission Theory
Hiroko ARAI and Takashi FUJIKAWA
Analytical Sciences, 2010, 26(2), 147.
DOI: 10.2116/analsci.26.147
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Determination of Surface Composition by X-ray Photoelectron Spectroscopy Taking into Account Elastic Photoelectron Collisions
Aleksander JABLONSKI
Analytical Sciences, 2010, 26(2), 155.
DOI: 10.2116/analsci.26.155
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Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy
Takaharu NAGATOMI and Shigeo TANUMA
Analytical Sciences, 2010, 26(2), 165.
DOI: 10.2116/analsci.26.165
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Electron Spectroscopy of Corrugated Solid Surfaces
J. ZEMEK
Analytical Sciences, 2010, 26(2), 177.
DOI: 10.2116/analsci.26.177
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Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures
Y. FUKUDA
Analytical Sciences, 2010, 26(2), 187.
DOI: 10.2116/analsci.26.187
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ISO-Compliant Calibration of Energy and Intensity Scales of Electron Spectrometers
Kazuhiro YOSHIHARA
Analytical Sciences, 2010, 26(2), 199.
DOI: 10.2116/analsci.26.199
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Original Papers

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Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
Mineharu SUZUKI, Nobuaki URUSHIHARA, Noriaki SANADA, Dennis F. PAUL, Scott BRYAN, and John S. HAMMOND
Analytical Sciences, 2010, 26(2), 203.
DOI: 10.2116/analsci.26.203
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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
Jirí PAVLUCH, Ludomir ZOMMER, Karel MAŠEK, Tomáš SKÁLA, František ŠUTARA, Václav NEHASIL, Igor PÍŠ, and Yaroslav POLYAK
Analytical Sciences, 2010, 26(2), 209.
DOI: 10.2116/analsci.26.209
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Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
Beata LESIAK, Josef ZEMEK, Jana HOUDKOVA, Alexander KROMKA, and Adam JÓZWIK
Analytical Sciences, 2010, 26(2), 217.
DOI: 10.2116/analsci.26.217
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Analysis of Ultra-Thin HfO2/SiON/Si(001): Comparison of Three Different Techniques
Kenji KIMURA, Kaoru NAKAJIMA, Thierry CONARD, Wilfried VANDERVORST, Andreas BERGMAIER, and Günther DOLLINGER
Analytical Sciences, 2010, 26(2), 223.
DOI: 10.2116/analsci.26.223
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hot article mark
Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
Masaaki KOBATA, Igor PÍŠ, Hideo IWAI, Hiromichi YAMAZUI, Hiroaki TAKAHASHI, Mineharu SUZUKI, Hiroyuki MATSUDA, Hiroshi DAIMON, and Keisuke KOBAYASHI
Analytical Sciences, 2010, 26(2), 227.
DOI: 10.2116/analsci.26.227
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Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements
Shinjiro HAYAKAWA, Aya TANAKA, and Takeshi HIROKAWA
Analytical Sciences, 2010, 26(2), 233.
DOI: 10.2116/analsci.26.233
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Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy
A. JABLONSKI and J. ZEMEK
Analytical Sciences, 2010, 26(2), 239.
DOI: 10.2116/analsci.26.239
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A Study of the Cascade Auger Process Using a Cluster Calculation
Sei FUKUSHIMA, and Satoshi OTA
Analytical Sciences, 2010, 26(2), 247.
DOI: 10.2116/analsci.26.247
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The Theoretical Study of Si Core Levels for the Change of Oxidation State
Sei FUKUSHIMA, and Satoshi OTA
Analytical Sciences, 2010, 26(2), 253.
DOI: 10.2116/analsci.26.253
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A Practical Method for Determining Minimum Detectable Values in Pulse-Counting Measurements
Yoichiro FURUKAWA, Manabu IWASAKI, and Akihiro TANAKA
Analytical Sciences, 2010, 26(2), 259.
DOI: 10.2116/analsci.26.259
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Structure of Ultra-Thin Diamond-Like Carbon Films Grown with Filtered Cathodic Arc on Si(001)
Alberto HERRERA-GOMEZ, Yongjian SUN, Francisco-Servando AGUIRRE-TOSTADO, Cherngye HWANG, Pierre-Giovanni MANI-GONZALEZ, Eric FLINT, Francisco ESPINOSA-MAGAÑA, and Robert M. WALLACE
Analytical Sciences, 2010, 26(2), 267.
DOI: 10.2116/analsci.26.267
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Evaluation of Outermost Surface Temperature of Silicon Substrates during UV-Excited Ozone Oxidation at Low Temperature
Naoto KAMEDA, Tetsuya NISHIGUCHI, Yoshiki MORIKAWA, Mitsuru KEKURA, Ken NAKAMURA, Tomoharu USHIYAMA, Hidehiko NONAKA, and Shingo ICHIMURA
Analytical Sciences, 2010, 26(2), 273.
DOI: 10.2116/analsci.26.273
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X-ray Fluorescence Analysis of Cr6+ Component in Mixtures of Cr2O3 and K2CrO4
Tatsunori TOCHIO, Shusuke SAKAKURA, Hirofumi OOHASHI, Hirohisa MIZOTA, Yanhui ZOU, Yoshiaki ITO, Sei FUKUSHIMA, Shigeo TANUMA, Takashi SHOJI, Hajime FUJIMURA, and Michiru YAMASHITA
Analytical Sciences, 2010, 26(2), 277.
DOI: 10.2116/analsci.26.277
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Notes

Quantitative Estimation Methods for Concentrations and Layer Thicknesses of Elements Using Edge-jump Ratios of X-ray Absorption Spectra
Takahito OSAWA
Analytical Sciences, 2010, 26(2), 281.
DOI: 10.2116/analsci.26.281
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Announcements

Analytical Sciences, 2010, 26(2), 285.
DOI: 10.2116/analsci.26.285
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