Analytical Sciences

Relationship between Width and Height of π* Peak in C K-XANES of Graphitic Carbons

Yasuji MURAMATSU, Kentaro MURAYAMA, Toru OKADA, and Tsuyoshi OOE

Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan

The relationship between the width and height of the π* peak on X-ray absorption near edge structure (XANES) in the C K region of graphitic carbons is investigated from XANES measurements and theoretical analysis. This relationship is herein named the “characteristic diagram of π* peak profile”. Mechanically ground (MG) graphite experimentally exhibits a linear correlation on the diagram. To understand the linear correlation, C K-XANES of the graphitic hexagonal carbon layers are calculated using first-principles calculations by focusing on the edge carbon atoms. The linear correlation is well explained by the ratio of the edge carbon atoms of the graphitic hexagonal carbon layers. The characteristic diagram of π* peak profile is applied to industrial carbon black (CB) for identification. CBs exhibit identical distributions on the diagram, which depend on their uses. It is therefore confirmed that the proposed characteristic diagram of π* peak profile can be a useful tool to identify graphitic carbons from the edge carbon atoms.

J-STAGE: View this article in J-STAGE