Abstract − Analytical Sciences, 36(12), 1507 (2020).
Total-Electron-Yield Measurements by Soft X-Ray Irradiation of Insulating Organic Films on Conductive Substrates
Yasuji MURAMATSU* and Eric M. GULLIKSON**
*Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan
**Center for X-Ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
**Center for X-Ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
The photocurrent (sample current) of insulating 0.7-μm thick polyethylene terephthalate (PET) films on conductive substrates (C, Au, Cu) was clearly measured through the substrates during soft X-ray irradiation on the PET films. X-ray absorption measurements of the PET/conductive-substrates using the total-electron-yield (TEY) method by measuring sample current easily provide the X-ray absorption spectra (XAS) of PET films, which are independent of the substrates. From additional X-ray absorption measurements using self-standing PET/Au and Au/PET-films, I–V measurements, and thickness-dependent sample current measurements, it can be confirmed that electrically conductive paths form in the insulating PET film in thickness direction along the soft X-ray beam trajectory. Such phenomena enable easy and simple TEY-XAS measurements of insulating μm-order-thick samples.
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