Abstract − Analytical Sciences, 33(5), 635 (2017).
Trace Elemental Determination Using a Portable Total Reflection X-Ray Fluorescence Spectrometer with a Collodion Film Sample Holder
Shinsuke KUNIMURA and Tomoki SHINKAI
Department of Industrial Chemistry, Faculty of Engineering, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku, Tokyo 162-8601, Japan
Using a portable total-reflection X-ray fluorescence (TXRF) spectrometer with a collodion film sample holder, a spectrum of an analyte containing 50 ng of aluminum was measured. The Al Kα line (1.49 keV) that partially overlaps with the Si Kα line (1.74 keV) from a quartz glass substrate usually used as a sample holder for TXRF analysis, was clearly detected when using the collodion film sample holder. To investigate the quantitative performance of the portable spectrometer with a collodion film sample holder, the concentrations of Cr, Mn, and Fe in a certified reference material of river water (JSAC 0302-3b), whose certified values are 10.0, 5.1, and 59.6 μg/L, respectively, were determined by the internal-standard method. We showed that approximate concentrations of these elements were determined.
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