Analytical Sciences

Multi-Element Analysis by Portable Total Reflection X-ray Fluorescence Spectrometer

Ying LIU, Susumu IMASHUKU, and Jun KAWAI

Department of Materials Science and Engineering, Kyoto University, Sakyo, Kyoto 606-8501, Japan

Multi-element solutions containing the 11 elements S, K, Sc, V, Mn, Co, Cu, Ga, As, Br and Y were analyzed by a portable total reflection X-ray fluorescence (TXRF) spectrometer. The excitation parameters (glancing angle, operational voltage and current) and sample amount were optimized for the portable TXRF in order to realize the smallest possible detection limits for all elements. The excitation parameter dependencies of the fluorescence signal and background for the detected elements are explained in detail. Background contributed by the sample carrier is also discussed. Consequently, nine elements were detectable at sub-nanogram levels in a single measurement of 10 min under the optimal experimental conditions. The portable TXRF spectrometer was found to be suitable for simultaneous multi-element analysis with low detection limits. The features of high sensitivity, small sample amount required, and fast detection of a wide range of elements make the portable TXRF a valuable tool in various applications, such as field studies in environmental and geological investigations.

J-STAGE: View this article in J-STAGE