Abstract − Analytical Sciences, 24(1), 87 (2008).
Construction and Evaluation of a Miniature Electron Ion Coincidence Analyzer Mounted on a Conflat Flange with an Outer Diameter of 114 mm
Takuhiro KAKIUCHI,*1 Eiichi KOBAYASHI,*2 Koji K. OKUDAIRA,*3 Narihiko FUJITA,*4 Masatoshi TANAKA,*4 and Kazuhiko MASE*1,*2,*5
*1 School of High Energy Accelerator Science, The Graduate University for Advanced Studies, 1-1 Oho, Tsukuba 305-0801, Japan
*2 Institute of Materials Structure Science, KEK, 1-1 Oho, Tsukuba 305-0801, Japan
*3 Faculty of Engineering, Chiba University, 1-33 Yayoi, Inage, Chiba 263-8522, Japan
*4 Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan
*5 PRESTO, Japan Science and Technology Agency, 5 Sanbancho, Chiyoda, Tokyo 102-0075, Japan
*2 Institute of Materials Structure Science, KEK, 1-1 Oho, Tsukuba 305-0801, Japan
*3 Faculty of Engineering, Chiba University, 1-33 Yayoi, Inage, Chiba 263-8522, Japan
*4 Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan
*5 PRESTO, Japan Science and Technology Agency, 5 Sanbancho, Chiyoda, Tokyo 102-0075, Japan
We have developed a miniature electron ion coincidence (EICO) analyzer mounted on a conflat flange with an outer diameter of 114 mm. It consists of a cylindrical mirror analyzer (CMA), a time-of-flight ion mass spectrometer (TOF-MS), a commercially available linear motion feedthrough, and a tilt adjustment mechanism. Each sample surface was irradiated by synchrotron radiation, and the energies of emitted electrons were analyzed and detected by the CMA, while desorbed ions were collected by the TOF-MS in coincidence with the electrons. The performance of the EICO analyzer was tested by measuring the Auger-electron H+ photoion coincidence spectrum of condensed water at 4a1 ← O 1s resonance.
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