Analytical Sciences

Emission Characteristics of the Dielectronic Recombination Line of Atomic Cu and Selectively Excited Ionic Cu Line by Resonance Charge-Transfer Collision in a Low-Pressure Laser-Induced Plasma

Hideyuki MATSUTA,* Kazuaki WAGATSUMA,* and Kuniyuki KITAGAWA**

*Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577, Japan
**Ecotopia Science Institute, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan

Emisson spectra and time-resolved two-dimensional (2D) emission images of the electron-ion dielectronic recombination (i.e. a reversal process of auto-ionization) line of neutral Cu atoms, the selectively excited Cu ionic line, and normal Cu atomic line were observed for understanding the excitation mechanisms of Cu neutral and ionic lines in a low-pressure laser-induced plasma (LP-LIP) of Ar. From the observations, the number of charged particles around the emitting species seems to increase with increasing Ar pressure. Different time-resolved 2D emission images were observed among the selectively excited Cu ionic line and other Cu emission lines resulting from the different excitation mechanisms of the respective emission lines. Collisions of the second kind and electron-ion recombinations were found to be one of the major excitation mechanisms of Cu in Ar LP-LIP.

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