Abstract − Analytical Sciences, 21(7), 757 (2005).
Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials
M. K. TIWARI, S. R. NAIK, G. S. LODHA, and R. V. NANDEDKAR
Synchrotron Utilization Division, Centre for Advanced Technology, Indore-452013, India
Incident primary beam divergence is a source of systematic error in X-ray standing wave (XSW) characterization of single and multilayer thin films. Primary beam divergence significantly alters the XSW profile of a layered material and can lead to large errors when used with higher excitation energies. The present study suggests that when one uses Mo-Kα excitation, the primary beam divergence should be in range of 0.0050. On the other hand, in the case of Cu-Kα excitation, primary beam divergence can be relaxed up to 0.010.
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