Abstract − Analytical Sciences, 14(6), 1139 (1998).
Possibility of the Discrimination of Different ChemicalStates by Energy-Dispersive X-Ray Spectroscopy
Yanan XIAO, ShinjiroHAYAKAWA, Yohichi GOHSHI and Masaharu OSHIMA
Department of Applied Chemistry,School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo113-8656, Japan
The chemical shift of the characteristic fluorescenceX-ray emission line is far smaller than the resolution of a detector widelyused in energy-dispersive spectroscopy, such as a Si(Li) detector. The lineposition measured with this kind of detector greatly depends on manyfactors. In the present work, an energy-dispersive X-ray spectroscopymethod was introduced to precisely measure the chemical shift of thecharacteristic X-ray emission line by partitioning the measurement timeinto many subdivisions with a statistical data-processing procedure. Thepossibility of this method was also considered theoretically. The chemicalstate of an element could be identified by using a reference material. Thediscrimination limit was found to be less than 0.3 eV if electric signalprocessing could be carefully controlled. (Keywords: Second statistical, chemical shift, energy dispersive,X-ray emission line, Si(Li) detector)
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