Analytical Sciences

TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover

Hitoshi YAMAGUCHI*, Shinji ITOH*, Shukuro IGARASHI**, Kunishige NAITOH** and Ryosuke HASEGAWA*

*National Research Institute for Metals, Sengen, Tsukuba, Ibaraki 305-0047, Japan
**Department of Materials Science, Faculty of Engineering, Ibaraki University, Nakanarusawa, Hitachi, Ibaraki 316-8511, Japan

The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al K a (1.487 keV) and P K a (2.013 keV) peaks is possible because of the reduction of Si Ka X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed. (Keywords: Total reflection X-ray fluorescence analysis, silicon wafer sample-carrier, polyester cover, high-purity iron, trace impurities)

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